Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile , walkie-talkies, computers, etc.This product SCPE015 is the tiniest series in semiconductor test probes since its outside diameter is only 0.15mm. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production also meet the needs for mass production.Its parameters are as below.Materials (plated)Specifications:
